30 Jun - 03 Jul 2015
Conference
60 EUR
International Conference on Pattern Recognition and Machine Intelligence
Timings
08:30 AM - 11:00 PM (Jun 30) (General)
Entry Fees
60 EUR
Estimated Turnout
Delegates
Event type
Conference
Event Details:
- Date: 30 Jun - 03 Jul 2015
- Time: 08:30 AM - 11:00 PM (Jun 30) (General)
- Location: Poland , Warsaw
- Type: Conference
Join us at the International Conference on Pattern Recognition and Machine Intelligence, a premier event hosted by the Faculty of Materials Science and Engineering at Warsaw University of Technology. This significant gathering is scheduled from June 30th to July 3rd, 2015, at the prestigious Warsaw University of Technology, located in the vibrant city of Warsaw, Poland.
This conference is a must-attend for professionals and enthusiasts in the fields of pattern recognition, machine learning, image processing, and more. With a focus on areas such as Content Based Image Retrieval, Computer Vision, Medical Imaging, Data Mining & Knowledge Discovery, Text Mining, Natural Language Processing, and Computing with Words, attendees are guaranteed to leave with valuable insights and knowledge.
Whether you're interested in the latest advancements in Machine Learning, seeking innovative solutions in Computer Vision, or looking to explore the vast world of Data Mining & Knowledge Discovery, this conference is the perfect opportunity to connect with like-minded professionals and pioneers in the industry. Don't miss out on this opportunity to enhance your skills, knowledge, and professional network in the bustling setting of Warsaw, Poland.
Categories: Poland
Tags: Business Services, Computer & Gadgets, Machine Learning
Entry Fees
- Paid Ticket - 60 EUR
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